IC SCAN TEST DEVICE W/FF 24-DIP
| Series | 74BCT |
| Package | Tube |
| Part Status | Obsolete |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Through Hole |
| Quantity | Unit Price (USD) |
|---|---|
| 1+ | $0.0000 |
| Series | 74BCT |
| Package | Tube |
| Part Status | Obsolete |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Through Hole |
| Package / Case | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package | 24-PDIP |
The Texas Instruments SN74BCT8374ANTG4 is a IC SCAN TEST DEVICE W/FF 24-DIP. This component belongs to the Logic - Specialty Logic category and features Package of Tube, Mounting Type of Through Hole. As an authorized distributor, SecureChip offers genuine Texas Instruments components with competitive pricing and fast delivery worldwide.
Whether you need the Texas Instruments SN74BCT8374ANTG4 for prototype design, mass production, or maintenance and repair, our ample stock and technical support team ensure you receive the right components on time.